12667, LEIT-C-PLAST
XTEM TEM Sample Preparation Kit
EMS offers this kit specifically for the preparation of cross-sectional TEM (XTEM) specimens.
For the study of interfaces (such as semiconductor devices, thin film layers, etc.) by transmission electron microscope (TEM) it is critical to use TEM samples of ultimate quality (perfectly embedded, mechanically pretreated and ion milled ones). EMS offers a complete technology and product range for preparing cross-sectional samples of these quality including specially designed mechanical sample preparation tools and embedding ring. The EMS-XTEMprep Preparation Kit offers all the tools and materials that help to prepare high-quality cross-sectional TEM specimens
€64.94
SKU
EMS_12667
The Kit includes
- Microsaw – sectioning tool
- Micropol – grinder and polisher
- Microheat – embedding tool
- Embedding rings ("Ti disc") – 5 of each size
- Special purpose mechanical tools (HSS) for embedding
- Ion beam resistant glue
- LEIT-C conductive carbon cement
- Thermoplastic transparent glue
- Diamond paste
| Manufacturer | Electron Microscopy Sciences |
|---|---|
| Size / Rxns Number: | No |
| Protocol & Manual | No |
| Technical Tips | No |
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