AGS1937VTD,  ULTRA THIN TIN ON C WAFER TEST

AGS1937VTD, ULTRA THIN TIN ON C WAFER TEST

AGS1937VTSI,  Tin on 200um silicon substrate. 5 - 30um

AGS1937VTSI, Tin on 200um silicon substrate. 5 - 30um

AGS1937VTS, Ultra Thin Tin on Carbon Wafer Test Specimen - Short Pin Stu

AGS1937VTS, Ultra Thin Tin on Carbon Wafer Test Specimen - Short Pin Stu
€294.20
SKU
AGAR_S1937VTS
AGS1937VTS, Ultra Thin Tin on Carbon Wafer Test Specimen - Short Pin Stu
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Manufacturer Agar Scientific
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