AGS1988VTSI, Tin on 200um silicon substrate. 20 - 400nm

This range of gold on silicon and tin on silicon specimens has been specifically developed for use in conjunction with line width calibration wafers or other test systems where the height of a conventional specimen is a problem. The specimens have the same specifications as the larger standard calibration specimens, but are prepared on a very thin silicon substrates. These are 5 x 5mm, 500µm thick and approximately 7 x 7mm, 230-330µm thick.

Specimens are supplied unmounted.