AGT701, Silicon AFM Probes w/ Al reflective backside coating (Pk 10)

Developed and manufactured by NuNano, these Silicon AFM probes are designed for general purpose imaging on a wide range of samples and are manufactured to a high quality for reliable imaging with every probe.

Probe characteristics:

• A sharpened conical tip with a radius of curvature of less than 10nm
• Minimal variation in spring constant and resonant frequency between probes
• Accurately defined tip position

The probes have a cantilever anchor. The anchor allows the cantilever to protrude further from the probe substrate, reducing the likelihood of the corners of the substrate touching the sample. Despite the anchor being higher than the apex of the tip, when tilted at it's operation angle (typically 12°) there is at least 20um of clearance between the anchor and the sample. Please be careful not to align the laser on the anchor.

The high quality manufacturing process allows the position of the cantilever to be defined with a high degree of accuracy, giving the user confidence when engaging the tip over a specific region of the sample. The tip is positioned at the centre of a 7.5um radius circle defined by the curved end of the cantilever.

Supplied in samples packs of 3 and production packs of 10.

High resolution imaging courtesy of Prof Peter Beton & Dr Vladimir Korolkov, The University of Nottingham. A bilayer of C60 molecules on a gold (111) surface, imaged in AC mode, ambient environment using a NuNano Scout 350R probe in an Asylum Research Cypher AFM.